Engineering Jobs in Haifa, Israel (Now Hiring) — 285 open — Page 6

Minimum qualifications:

• Bachelor's degree in Electrical Engineering, a related field, or equivalent practical experience.
• 4 years of experience with Design For Test (DFT) methodologies, DFT verification, and industry-standard DFT tools.
  
• Experience with ASIC DFT synthesis, simulation, and verification flow.
• Experience in DFT specification, definition, architecture, and insertion.
  

Preferred qualifications:

• Master's degree in Electrical Engineering, or a related field.
• Experience working with ATE engineers (e.g., silicon bring-up, patterns generation, debug, validation on automatic test equipment, debug of silicon issues).
• Experience in IP integration (e.g., memories, test controllers, Test Access Point (TAP), and Memory Built-In Self Test (MBIST)).
• Experience in SoC cycles, silicon bringup, and silicon debug activities.
  
• Experience in fault modeling.

About the job:

As a System on a Chip (SoC) Design for Test (DFT) Engineer, you will be responsible for defining, implementing, and deploying advanced DFT methodologies for digital or mixed-signal chips. You will define silicon test strategies, DFT architecture, and create DFT specifications for next generation SoCs. You will design and verify the DFT logic and prepare for post silicon and co-work/debug with test engineers.

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Responsibilities:

• Develop DFT strategy and architecture (e.g., Memory Built-In Self Test (MBIST), Automatic Test Pattern Generation (ATPG), hierarchical DFT).
• Complete all Test Design Rule Checks (TDRC) and design changes to fix TDRC violations to achieve high-test quality.
• Insert DFT logic, boundary scan, scan chains, DFT Compression, Logic Built-In Self Test, Test Access Point (TAP) controller, clock control block, and other DFT IP blocks.
• Insert MBIST logic including test collar around memories, MBIST controllers, eFuse logic, and connect to core and TAP interfaces.
• Document DFT architecture, test sequences, and boot-up sequences associated with test pins.