The group you’ll be a part of

In the Global Products Group, we are dedicated to excellence in the design and engineering of Lam’s etch and deposition products. We drive innovation to ensure our cutting-edge solutions are helping to solve the biggest challenges in the semiconductor industry.    

The impact you’ll make

This position is an exciting opportunity to join Lam's electron microscopy team in Fremont, CA! We own and operate several generations of FEI/Thermo Fisher Helios Dual Beam Focused Ion Beam (FIB) tools, including the latest models.  
Work Schedule: 3rd shift (night shift) 10:30 p.m. - 6:30 a.m. Sunday to Thursday or Monday to Friday. 

What you’ll do

•    The primary function is preparing lamella using Thermo Fisher Helios Dual Beam FIB tools, to be imaged either using in-situ STEM detector or on TEM sample preparation. 
•    Set up, operate, and troubleshoot equipment.
•    Proper handling of sensitive customer samples and intellectual property. 
•    Work with process engineers to understand how to locate regions of interest, best process their samples, interpreting data, and troubleshooting when data does not meet expectations.   
•    Maintain integrity of experiments and data to provide valid results. 
•    Actively participate in developing new techniques to expedite sample processing.
•    Provide new learnings and developments to other team members through documentation, presentations, and training sessions Collaborate with process engineers.
•    Participate in evaluating new instruments for lab growth.
•    Foster a healthy and inclusive working environment. 
•    Maintain a professional atmosphere and cordial working relationships. 
•    Adhere to Lam's Core Values 

Who we’re looking for

Minimum Qualifications:

•    Major in Materials Science, Chemical Engineering, Chemistry or Physics; or microscopy program.
•    AS or BS degree candidate with relevant microscopy experience or industry experience
•    Good written and verbal communication skills to work with a large internal customer base. 
•    Experience creating technical documentation.     

Preferred qualifications

•    1+ years of focused experience in dual beam FIB, SEM operation, and TEM sample preparation work experience 
•    Hands-on experience of Thermo Fisher Helios series tools.
•    Knowledge of semiconductor devices and industry. 
•    Candidate should be self-motivated, organized, and interested in learning.
•    Experience handling and protecting sensitive customer intellectual property. 

Our commitment

We believe it is important for every person to feel valued, included, and empowered to achieve their full potential. By bringing unique individuals and viewpoints together, we achieve extraordinary results.

Lam Research ("Lam" or the "Company") is an equal opportunity employer. Lam is committed to and reaffirms support of equal opportunity in employment and non-discrimination in employment policies, practices and procedures on the basis of race, religious creed, color, national origin, ancestry, physical disability, mental disability, medical condition, genetic information, marital status, sex (including pregnancy, childbirth and related medical conditions), gender, gender identity, gender expression, age, sexual orientation, or military and veteran status or any other category protected by applicable federal, state, or local laws. It is the Company's intention to comply with all applicable laws and regulations. Company policy prohibits unlawful discrimination against applicants or employees.

Lam offers a variety of work location models based on the needs of each role. Our hybrid roles combine the benefits of on-site collaboration with colleagues and the flexibility to work remotely and fall into two categories – On-site Flex and Virtual Flex. ‘On-site Flex’ you’ll work 3+ days per week on-site at a Lam or customer/supplier location, with the opportunity to work remotely for the balance of the week. ‘Virtual Flex’ you’ll work 1-2 days per week on-site at a Lam or customer/supplier location, and remotely the rest of the time.

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